Imaging nanoscale features with plasmoncoupled leakage radiation far-field superlenses

Optics Express

Volumn 20, Issue 19, 2012, Pages 20827-20834

  Regan, Charles J ^a   Rodriguez, Robier ^b   Gourshetty, Shivkumar C ^a   De Peralta, Luis Grave ^a,b   Bernussi, Ayrton A ^a  

^a Texas Tech University   (United States)

^b TEXAS TECH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; GEOMETRICAL OPTICS; OPTICAL MICROSCOPY;

FAR-FIELD; LEAKAGE RADIATION; NANO SCALE; NANOSCALE FEATURES; NEAR-FIELD FLUORESCENCE; OPTICAL IMAGE; PLASMONIC CRYSTALS; SUPERLENSES; SURFACE PLASMON POLARITONS;

NANOTECHNOLOGY;

EID: 84866252600     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.020827     Document Type: Article

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