Electrical and Fourier transform infrared properties of epitaxial SmNiO 3 tensile strained thin film

Applied Physics Letters

Volumn 101, Issue 9, 2012, Pages

  Torriss, Badr ^a   Chaker, Mohamed ^a   Margot, Joëlle ^b  

^a INRS EMT   (Canada)

^b UNIVERSITÉ DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BULK SAMPLES; FOURIER TRANSFORM INFRARED; MIDINFRARED; RECIPROCAL SPACE MAPS; SRTIO; STRAINED THIN FILMS;

EPITAXIAL GROWTH; PULSED LASER DEPOSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; THIN FILMS;

ELECTRIC PROPERTIES;

EID: 84865842718     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4748982     Document Type: Article

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