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Volumn 51, Issue 9, 2012, Pages

Compensation of native defect acceptors in microcrystalline Ge and Si 1-xGe x thin films by oxygen incorporation: Electrical properties and solar cell performance

Author keywords

[No Author keywords available]

Indexed keywords

ACCEPTOR STATE; CRYSTALLINE GRAINS; CRYSTALLINE VOLUME FRACTION; FREE HOLES; HIGH CONCENTRATION; I-LAYER; NATIVE DEFECT; ORDERS OF MAGNITUDE; OXYGEN DONORS; OXYGEN INCORPORATION; PHOTOCARRIER; SOLAR CELL PERFORMANCE;

EID: 84865842226     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.51.091302     Document Type: Article
Times cited : (6)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.