Evidence for phase change memory behavior in In 2(Se xTe 1-x) 3 thin films

Electronic Materials Letters

Volumn 8, Issue 4, 2012, Pages 417-421

  Matheswaran, P ^a   Sathyamoorthy, R ^a   Asokan, K ^b  

^a KONGUNADU ARTS AND SCIENCE COLLEGE   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

indium chalcogenide; phase change; surface morphology

Indexed keywords

CRYSTALLINE SAMPLES; CURRENT SWITCHES; ELEMENTAL COMPOSITIONS; ISLAND STRUCTURE; PHASE CHANGE; SEM IMAGE; TEMPERATURE DEPENDENT; THREE ORDERS OF MAGNITUDE;

CRYSTALLINE MATERIALS; PHASE CHANGE MEMORY; SURFACE MORPHOLOGY; THERMAL EVAPORATION; THIN FILMS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84865813917     PISSN: 17388090     EISSN: 20936788     Source Type: Journal    
DOI: 10.1007/s13391-012-2020-3     Document Type: Article

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