InxTey semiconductor thin films obtained by co-evaporation

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 497-501

  Guettari, N ^a   Amory, C ^b   Morsli, M ^b   Bernede J C ^b   Khelil, A ^a  

^a UNIVERSITY OF ORAN   (Algeria)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

Grain boundary; Indium telluride; Thin films

Indexed keywords

CARRIER CONCENTRATION; CHEMICAL BONDS; DEPOSITION; ELECTRIC PROPERTIES; EVAPORATION; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CRUCIBLE TEMPERATURES;

THIN FILMS;

EID: 0038356545     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00240-2     Document Type: Conference Paper

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