100-fold reduction of electric-field noise in an ion trap cleaned with insitu argon-ion-beam bombardment

Physical Review Letters

Volumn 109, Issue 10, 2012, Pages

  Hite, D A ^a   Colombe, Y ^a   Wilson, A C ^a   Brown, K R ^a,b   Warring, U ^a   Jordens R ^a   Jost, J D ^a   McKay, K S ^a   Pappas, D P ^a   Leibfried, D ^a   Wineland, D J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b GEORGIA TECH RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFTER-TREATMENT; ATOMIC IONS; CLEANING TREATMENT; EXPERIMENTAL EVIDENCE; FREQUENCY RANGES; IN-SITU; ION TRAPS; LOW LEVEL; NOISE EMANATING; OVERLAYERS; QUANTUM BITS; SURFACE SCIENCE;

ELECTRODES; HEATING RATE; ION BEAMS; QUANTUM COMPUTERS;

ARGON;

EID: 84865747537     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.103001     Document Type: Article

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