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Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 84, Issue 2, 2011, Pages

Microscopic model of electric-field-noise heating in ion traps

(4) Safavi Naini, A a,b Rabl, P c Weck, P F d Sadeghpour, H R b

a MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

b HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS (United States)

c ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE (Austria)

d UNIVERSITY OF NEVADA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; ELECTRIC FIELD FLUCTUATIONS; ELECTRODE SURFACES; FIRST-PRINCIPLES CALCULATION; FLUCTUATORS; FUNCTION OF FREQUENCY; HIGHER TEMPERATURES; ION TRAPS; MICROFABRICATED; MICROSCOPIC MODELS; NOISE SPECTRA; PROCESSING DEVICE; RANDOM DISTRIBUTION; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENCIES; THEORETICAL MODELS; THERMALLY ACTIVATED; TRANSITION RATES; VIBRATIONAL STATE;

ATOMIC SPECTROSCOPY; CALCULATIONS; DAMAGE DETECTION; ELECTRIC FIELDS; IONS;

HEATING;

EID: 80051948366 PISSN: 10502947 EISSN: 10941622 Source Type: Journal
DOI: 10.1103/PhysRevA.84.023412 Document Type: Article

Times cited : (100)

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