Fabrication and heating rate study of microscopic surface electrode ion traps

New Journal of Physics

Volumn 13, Issue , 2011, Pages

  Daniilidis, N ^a,b   Narayanan, S ^a,b   Moller S A ^a,b   Clark, R ^b,c   Lee, T E ^d   Leek, P J ^e   Wallraff, A ^e   Schulz, St ^c   Schmidt Kaler, F ^f   Haffner H ^a,g  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Institut fur Quantenoptik and Quanteninformation   (Austria)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d California Institute of Technology   (United States)

^e ETH ZURICH   (Switzerland)

^f JOHANNES GUTENBERG UNIVERSITY   (Germany)

^g LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS DIELECTRICS; ANOMALOUS HEATING; DOPPLER; EXCESSIVE HEATING; IMPURITY ATOMS; ION TRAPS; METAL SURFACES; MICROFABRICATED; MICROSCOPIC SURFACE; NOISE SPECTRA; NOISE SPECTRAL DENSITY; ORDER OF MAGNITUDE; RATE MEASUREMENTS; RE-COOLING; ROOM TEMPERATURE; SAPPHIRE SURFACE; SURFACE CONTAMINATIONS;

HEATING RATE; IONS; SPECTRAL DENSITY;

HEATING;

EID: 79251572053     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/13/1/013032     Document Type: Article

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