Sub-wavelength GaN-based membrane high contrast grating reflectors

Optics Express

Volumn 20, Issue 18, 2012, Pages 20551-20557

  Wu, Tzeng Tsong ^a   Syu, Yu Cheng ^a   Wu, Shu Hsien ^a   Chen, Wei Ting ^b   Lu, Tien Chang ^a   Wang, Shing Chung ^a   Chiang, Hai Pang ^c,d   Tsai, Din Ping ^b,e  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^d INSTITUTE OF PHYSICS   (Taiwan)

^e RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; FABRICATION; FACTOR ANALYSIS; FINITE DIFFERENCE TIME DOMAIN METHOD; GALLIUM NITRIDE; REFLECTION;

AIR-GAPS; BROAD BANDWIDTHS; E-BEAM LITHOGRAPHY; FILLING FACTOR; FINITE-DIFFERENCE TIME-DOMAIN (FDTD) METHODS; GRATING PERIODS; GRATING REFLECTORS; HIGH CONTRAST; HIGH REFLECTIVITY; LIGHT EMITTING DEVICES; MICRO-REFLECTIVITY; OPTIMIZED SIMULATION; RIGOROUS COUPLED WAVE ANALYSIS; STOPBAND; STRUCTURAL PARAMETER; SUB-WAVELENGTH; UV REGION;

GALLIUM ALLOYS;

GALLIUM; GALLIUM NITRIDE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; COMPUTER AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INSTRUMENTATION; OPTICAL INSTRUMENTATION; REFRACTOMETRY;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GALLIUM; LENSES; MEMBRANES, ARTIFICIAL; REFRACTOMETRY;

EID: 84865729741     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.020551     Document Type: Article

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