Surface enhanced Raman scattering in the presence of multilayer dielectric structures

Journal of the Optical Society of America B: Optical Physics

Volumn 29, Issue 8, 2012, Pages 1863-1874

  Delfan, Aida ^a   Liscidini, Marco ^b   Sipe, John E ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

RAMAN SCATTERING; RAMAN SPECTROSCOPY; SENSORS; SURFACE WAVES;

ANALYTICAL EXPRESSIONS; ARBITRARY MULTILAYERS; BEAM SIZE; DIELECTRIC STRUCTURE; FRESNEL COEFFICIENT; MULTILAYER DIELECTRICS; PERIODIC MULTILAYERS; PLANAR STRUCTURE; RAMAN CROSS SECTIONS; RAMAN SENSORS; SEMICLASSICAL APPROACHES; SPONTANEOUS RAMAN SCATTERING; SURFACE ENHANCED RAMAN SCATTERING (SERS); SYSTEMATIC STUDY;

MULTILAYERS;

EID: 84865725555     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.29.001863     Document Type: Article

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