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Volumn 358, Issue 17, 2012, Pages 2362-2365
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In XGa 1-XN films deposited by reactive RF-sputtering
a
GIFU UNIVERSITY
(Japan)
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Author keywords
In XGa 1 XN; Low temperature deposition; Photo absorption layer material; Photosensitivity; Simultaneous reactive rf magnetron sputtering
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Indexed keywords
COMPOSITION RATIO;
LOW-TEMPERATURE DEPOSITION;
OPTICAL BAND GAP ENERGY;
PHOTOABSORPTIONS;
RF-MAGNETRON SPUTTERING;
RF-SPUTTERING;
WURTZITES;
XRD PEAKS;
GALLIUM NITRIDE;
LIGHT SENSITIVE MATERIALS;
MAGNETRON SPUTTERING;
METALLIC FILMS;
OPTICAL BAND GAPS;
TEMPERATURE;
ZINC SULFIDE;
PHOTOSENSITIVITY;
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EID: 84865723565
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2012.01.023 Document Type: Conference Paper |
Times cited : (14)
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References (7)
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