Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopy

Ultramicroscopy

Volumn 122, Issue , 2012, Pages 6-11

  Mitome, Masanori ^a   Sawada, Hidetaka ^b,c   Kondo, Yukihito ^b,c   Tanishiro, Yasumasa ^b,d   Takayanagi, Kunio ^b,d  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JEOL LTD   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Aberration corrector; Boron nitride; High resolution; Nanosheet

Indexed keywords

ABERRATION CORRECTORS; ABERRATION-CORRECTED; ACCELERATION VOLTAGES; ATOMIC SPECIES; BORON ATOM; COLD FIELD EMISSIONS; HEXAGONAL BORON NITRIDE; HEXAGONAL RINGS; HIGH RESOLUTION; HIGH SENSITIVITY; IMAGE CONTRASTS; IMAGE INTENSITIES; INTENSITY DIFFERENCE; INTENSITY REDUCTION; NITROGEN ATOM; THINNING PROCESS;

BORON NITRIDE; ELECTRON BEAMS; MONOLAYERS; NANOSHEETS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

BORON; BORON NITRIDE NANOTUBE; NITROGEN; BORON NITRIDE NANOSHEET; NANOPARTICLE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC PARTICLE; CRYSTAL STRUCTURE; ELECTRIC POTENTIAL; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; HISTOGRAM; IMAGE ANALYSIS; MASS SPECTROMETRY; SENSITIVITY ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; ABERRATION CORRECTED TRANSMISSION ELECTRON MICROSCOPY; ATOM; ELECTRON RADIATION; IMAGE QUALITY; SIMULATION; SURFACE PROPERTY;

EID: 84865619193     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.028     Document Type: Article

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