A study on composition, structure and optical properties of copper-poor CIGS thin film deposited by sequential sputtering of CuGa/In and In/(CuGaIn) precursors

Journal of Crystal Growth

Volumn 359, Issue 1, 2012, Pages 1-10

  Park, Seong Un ^a   Sharma, Rahul ^a   Ashok, K ^a   Kang, San ^a   Sim, Jae Kwan ^a   Lee, Cheul Ro ^a  

^a Chonbuk National University   (South Korea)

Author keywords

A1. Cu poor; A3. Sputtering; B1. Precursor; B2. Cu(InGa)Se2 (CIGS); B2. Optical studies

Indexed keywords

B1. PRECURSOR; B2. CU(INGA)SE2 (CIGS); CIGS FILMS; CIGS THIN FILMS; CU-POOR; ELEMENTAL COMPOSITIONS; EMISSION PEAKS; OPTICAL STUDY; PL SPECTRA; PREFERRED ORIENTATIONS; SECONDARY ION MASS SPECTROSCOPY; SELENIZATION; SEQUENTIAL SPUTTERING; SODA-LIME GLASS;

CARRIER CONCENTRATION; COPPER; COPPER COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; GALLIUM; MOLYBDENUM; OPTICAL PROPERTIES; PHOTOELECTRONS; SECONDARY ION MASS SPECTROMETRY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

EID: 84865578236     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2012.08.013     Document Type: Article

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