Effect of thermal annealing on the structure, morphology, and electrical properties of Mo bottom electrodes for solar cell applications

Journal of the Korean Physical Society

Volumn 59, Issue 3, 2011, Pages 2280-2285

  Cha, Jun Ho ^a   Ashok, K ^a   Suthan Kissinger, N J ^a   Ra, Yong Ho ^a   Sim, Jae Kwan ^a   Kim, Jin Soo ^a   Lee, Cheul Ro ^a  

^a Chonbuk National University   (South Korea)

Author keywords

Solar cells; Surface analysis; Thin films; X ray diffraction

Indexed keywords

EID: 80052910873     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.59.2280     Document Type: Article

References (27)

1. A. Rockett and R. M. Barkmire, J. Appl. Phys. 70, R81 (1991).
2. K. Zweibel, Harnessing Solar Power: the Photovoltaic Challenge (Plenum Press, New York, 1990).
3. M. A. Contrearas, B. Egaas, K. Ramanathan, J. Hiltner, A. Swartzlander, F. Hasoon and R. Nou, Prog. Photovoltaics Res. Appl. 7, 311 (1999).
4. K. Granath, A. Rockett, M. Bodegard, C. Nender and L. Stolt, 13th European Photovoltaic Solar Energy Conference (Nice, France, 1995), p. 1983.
5. S. Ashour, S. Alkuhaimi, H. Moutinho, R. Matson and F. Abou-Elfotouh, Thin Solid Films 226, 129 (1993).
6. F. A. Abou-Elfotouh, L. L. Kazmerski, R. J. Matson, D. J. Dunlavy and T. J. Coutts, J. Vac. Sci. Technol., A 8, 3251 (1990).
7. J. H. Scofield, A. Duda, D. Albin, B. L. Ballard and P. K. Predecki, Thin Solid Films 260, 26 (1995).
8. K. Orgassa, H. W. Schock and J. H. Werner, Thin Solid Films 431-432, 387 (2003).
9. K. Matsunaga, T. Komaru, Y. Nakayama, T. Kume and Y. Suzuki, Technical Digest of PVSEC-17 (Fukuoka, Japan, 2007), p. 455.
10. B. Dimmler and R. Wachter, Thin Solid Films 515, 5973 (2007).
11. B. D. Cullity, Elements of X-ray Diffraction (Addition-Wesley, Massachusetts, 1956).
12. K. Otte, L. Makhova, A. Braun and I. Konovalov, Thin Solid Films 511, 613 (2006).
13. J. A. Thornton and D. W. Hoffman, Thin Solid Films 171, 5 (1989).
14. T. J. Vin, M. A. J. Somers, J. L. C. Daams and A. G. Dirks, J. Appl. Phys. 70, 4301 (1991).
15. T. Yamaguchi and R. Miyagawa, Jpn. J. Appl. Phys. 30, 2069 (1991).
16. B. L. Ballard, P. K. Pedecki, D. Albin and J. H. Scofield, Adv. X-Ray Anal. 37, 189 (1994).
17. T. T. Bardin, J. G. Pronkoz, R. C. Budhani, J. S. Lin and R. F. Bunshah, Thin Solid Films 165, 243 (1988).
18. L. Krusin-Elbaum, M. O. Aboelfotoh, T. Lin and K. Y. Ahn, Thin Solid Films 153, 346 (1987).
19. J. S. Lin, R. C. Budhani and R. F. Bunshah, Thin Solid Films 153, 359 (1987).
20. K. Kawabata, T. Tanaka and H. Kajioka, Mater. Sci. Eng., A 163, 163 (1993).
21. B. A. Anderson, C. Azar, J. Holmberg and S. Karlsson, Energy 23, 407 (1998).
22. P. P. Sahay, S. Tewari and R. K. Nath, Cryst. Res. Technol. 42, 723 (2007).
23. JCPDS 42-1120.
24. G. Gordillo, M. Grizalez and L. C. Hernandez, Sol. Energy Mater. Sol. Cells 51, 327 (1998).
25. J. A. Thornton, J. Vac. Sci. Technol. 11, 666 (1974).
26. E. F. Kaeble, Handbook of X-rays (McGraw-Hill, New York, 1967).
27. G. Korotcenkov, A. Cerneavschi, V. Brinzari, A. Vasiliev, M. Ivanov, A. Cornet, J. Morante, A. Cabot and J. Arbiol, Sens. Actuators, B 99, 297 (2004).