Growth and characterization of CIS thin films prepared by ion beam sputtering deposition

Chinese Physics Letters

Volumn 27, Issue 4, 2010, Pages

  Fan, Ping ^a   Liang, Guang Xing ^a   Zheng, Zhuang Hao ^a   Cai, Xing Min ^a   Zhang, Dong Ping ^a  

^a SHENZHEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY GAP; FILM PREPARATION; INDIUM COMPOUNDS; ION BEAMS; LIGHT TRANSMISSION; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; SPUTTERING; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

B-Y IONS; BK7 GLASS; CIS THIN FILMS; GLASS SUBSTRATES; ION BEAM SPUTTERING DEPOSITION; ION-BEAM-SPUTTERING; THIN-FILMS; THREE-LAYER FILM; VACUUM CHAMBERS; X- RAY DIFFRACTIONS;

COPPER COMPOUNDS;

EID: 77950572899     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/27/4/046801     Document Type: Article

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