Scanning tunneling microscopy/spectroscopy studies of resistive switching in Nb-doped SrTiO 3

Journal of Applied Physics

Volumn 112, Issue 2, 2012, Pages

  Chen, Y L ^a   Wang, J ^a   Xiong, C M ^a,b   Dou, R F ^a   Yang, J Y ^a   Nie, J C ^a  

^a BEIJING NORMAL UNIVERSITY   (China)

^b BEIJING COMPUTATIONAL SCIENCE RESEARCH CENTER   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DOMINANT MECHANISM; ELECTRODE CONTACTS; NANO-METER SCALE; NB-DOPED SRTIO; OXYGEN MIGRATION; RESISTIVE SWITCHING; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; SCANNING TUNNELING SPECTROSCOPY;

ELECTRONIC STRUCTURE; PHOTOELECTRONS; SCANNING TUNNELING MICROSCOPY; SWITCHING SYSTEMS; X RAY PHOTOELECTRON SPECTROSCOPY;

STRONTIUM TITANATES;

EID: 84865518179     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4733999     Document Type: Article

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