Grazing-incidence X-ray diffraction study of rubrene epitaxial thin films

Journal of Synchrotron Radiation

Volumn 19, Issue 5, 2012, Pages 682-687

  Fumagalli, Enrico ^a   Campione, Marcello ^a   Raimondo, Luisa ^a   Sassella, Adele ^a   Moret, Massimo ^a   Barba, Luisa ^b   Arrighetti, Gianmichele ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b CNR   (Italy)

Author keywords

epitaxy; GIXD; thin films

Indexed keywords

CRYSTALLINE STRUCTURE; ELECTRICAL PERFORMANCE; ELECTRONIC DEVICE; EPITAXIAL RELATIONSHIPS; EPITAXIAL THIN FILMS; GIXD; GRAZING INCIDENCE X-RAY DIFFRACTION; IN-PLANE ORIENTATION; MAIN TASKS; ORGANIC MOLECULAR BEAM EPITAXY; ORTHORHOMBIC POLYMORPH; PRECISELY ORIENTED; RUBRENE THIN FILMS; RUBRENES; SUBSTRATE SURFACE; TETRACENE;

CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; SEMICONDUCTING ORGANIC COMPOUNDS; X RAY DIFFRACTION;

THIN FILMS;

EID: 84865404622     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049512027562     Document Type: Article

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