The contribution of planes, vertices, and edges to recombination at pyramidally textured surfaces

IEEE Journal of Photovoltaics

Volumn 1, Issue 1, 2011, Pages 59-65

  Baker Finch, Simeon C ^a   McIntosh, Keith R ^b  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b PV Lighthouse   (Australia)

Author keywords

Photovoltaic cells; silicon; surface passivation; surface recombination; surface texture

Indexed keywords

PASSIVATED SURFACE; PROCESS CONDITION; SILICON SURFACES; SURFACE AREA; SURFACE PASSIVATION; SURFACE RECOMBINATIONS; SURFACE TEXTURES; TEXTURED SURFACE; THICK OXIDES;

PHOTOVOLTAIC CELLS; SILICON; SILICON NITRIDE; SILICON OXIDES; SURFACES; TEXTURES;

PASSIVATION;

EID: 84865190618     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2011.2165530     Document Type: Article

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