Impact of annealing on cuinse 2 thin films and its schottky interface

Journal of Nano- and Electronic Physics

Volumn 3, Issue 1 PART5, 2011, Pages 1086-1095

  Parihar, U ^a   Ray, J R ^b   Kumar, N ^a   Sachdeva, R ^a   Padha, N ^a   Panchal, C J ^b  

^a UNIVERSITY OF JAMMU   (India)

^b M S UNIVERSITY OF BARODA   (India)

Author keywords

CIS Thin film; Electrical characterization; Morphological; Structural; Thermal evaporation; Vacuum annealing

Indexed keywords

EID: 84865146500     PISSN: 20776772     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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