Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

Zeitschrift fur Kristallographie

Volumn 227, Issue 5, 2012, Pages 248-256

  Abeykoon, Milinda ^a   Malliakas, Christos D ^b   Juhás, Pavol ^c   Božin, Emil S ^a   Kanatzidis, Mercouri G ^b,d   Billinge, Simon J L ^a,c  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c Columbia University ^*  (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Electron diffraction; Nanomaterials; Pair distribution function; Polycrystalline films

Indexed keywords

EID: 84864979857     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2012.1510     Document Type: Article

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