Quantitative electron diffraction data of amorphous materials

Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

Volumn 60, Issue 6, 2005, Pages 459-468

  Ankele, Jürgen ^a   Mayer, Joachim ^b   Lamparter, Peter ^c   Steeb, Siegfried ^c  

^a NOKIA RESEARCH CENTER   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Amorphous Materials; Electron Diffraction; Multiple Scattering Correction

Indexed keywords

EID: 22644434446     PISSN: 09320784     EISSN: None     Source Type: Journal    
DOI: 10.1515/zna-2005-0612     Document Type: Article

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