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Volumn 135, Issue 1, 1998, Pages 78-85
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Structural characterization of nanocrystalline SnO2 by X-ray and Raman spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0002545229
PISSN: 00224596
EISSN: None
Source Type: Journal
DOI: 10.1006/jssc.1997.7596 Document Type: Article |
Times cited : (377)
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References (16)
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