Measurement of the docking time of a DNA molecule onto a solid-state nanopore

Nano Letters

Volumn 12, Issue 8, 2012, Pages 4159-4163

  Kowalczyk, Stefan W ^a   Dekker, Cees ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

access resistance; DNA; Nanopore; translocation

Indexed keywords

ACCESS RESISTANCE; COMPOSITE EVENT; COUNTERIONS; CURRENT CHANGE; CURRENT ENHANCEMENT; DNA MOLECULES; DNA TRANSLOCATION; PHYSICAL PICTURES; RANDOM COIL; RANDOM LOCATION; SINGLE EVENT; SOLID-STATE NANOPORE; TRANSLOCATION; VOLTAGE DEPENDENCE; VOLTAGE RANGES;

DOCKING; NANOPORES;

DNA;

DNA;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; NANOPORE; TIME;

DNA; ELECTRIC CONDUCTIVITY; NANOPORES; TIME FACTORS;

EID: 84864652882     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl301719a     Document Type: Article

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