Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations

Oral Surgery, Oral Medicine, Oral Pathology and Oral Radiology

Volumn 114, Issue 3, 2012, Pages 393-400

  Koivisto, J ^a   Kiljunen, T ^b   Tapiovaara, M ^c   Wolff, J ^d,e   Kortesniemi, M ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

^b International Comprehensive Cancer Center Docrates   (Finland)

^c STUK RADIATION AND NUCLEAR SAFETY AUTHORITY   (Finland)

^d TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^e TAMPERE UNIVERSITY HOSPITAL   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; BONE MARROW; BRAIN; COMPARATIVE STUDY; COMPUTER SIMULATION; CONE BEAM COMPUTED TOMOGRAPHY; ESOPHAGUS; EYE; FACIAL BONE; HEAD; HUMAN; IMAGE QUALITY; INSTRUMENTATION; LYMPH NODE; MALE; MONTE CARLO METHOD; MOUTH MUCOSA; RADIATION DOSE; RADIATION EXPOSURE; RADIOMETRY; RELATIVE BIOLOGIC EFFECTIVENESS; SALIVARY GLAND; SEMICONDUCTOR; SKIN; SKULL; STATISTICAL MODEL; THYROID GLAND; TOOTH RADIOGRAPHY;

BONE MARROW; BRAIN; COMPUTER SIMULATION; CONE-BEAM COMPUTED TOMOGRAPHY; ESOPHAGUS; EYE; FACIAL BONES; HEAD; HUMANS; LYMPH NODES; MALE; MODELS, STATISTICAL; MONTE CARLO METHOD; MOUTH MUCOSA; PHANTOMS, IMAGING; RADIATION DOSAGE; RADIOGRAPHY, DENTAL; RADIOMETRY; RELATIVE BIOLOGICAL EFFECTIVENESS; SALIVARY GLANDS; SKIN; SKULL; THYROID GLAND; TRANSISTORS, ELECTRONIC;

EID: 84864623945     PISSN: 22124403     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.oooo.2012.06.003     Document Type: Article

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