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Volumn 101, Issue 4, 2012, Pages

Optimization of sample-chip design for stub-matched radio-frequency reflectometry measurements

Author keywords

[No Author keywords available]

Indexed keywords

CHIP DESIGN; CONVENTIONAL DESIGN; ELECTRODE GEOMETRIES; GAAS/ALGAAS; IN-SITU; MATCHING CIRCUIT; QUANTUM POINT CONTACT; RADIO FREQUENCIES; REFLECTOMETRY MEASUREMENTS; SEMICONDUCTOR NANOSTRUCTURES; VARACTOR DIODES;

EID: 84864490214     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4739248     Document Type: Article
Times cited : (16)

References (21)
  • 6
    • 84864434336 scopus 로고    scopus 로고
    • M. Thalakulam, W. W. Xue, F. Pan, Z. Ji, J. Stettenheim, L. Pfeiffer, K. W. West, and A. J. Rimberg, e-print: arXiv:0708.0861v1.
    • M. Thalakulam, W. W. Xue, F. Pan, Z. Ji, J. Stettenheim, L. Pfeiffer, K. W. West, and A. J. Rimberg, e-print: arXiv:0708.0861v1.
  • 15
    • 0004099829 scopus 로고    scopus 로고
    • 3rd ed. (John Wiley Sons, Inc., USA).
    • D. M. Pozar, Microwave Engineering, 3rd ed. (John Wiley Sons, Inc., USA, 2005).
    • (2005) Microwave Engineering
    • Pozar, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.