A single-shot intensity-position monitor for hard X-ray FEL sources

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8140, Issue , 2011, Pages

  Feng, Yiping ^a   Feldkamp, Jan M ^a   Fritz, David M ^a   Cammarata, Marco ^a   Robert, Aymeric ^a   Caronna, Chiara ^a   Lemke, Henrik T ^a   Zhu, Diling ^a   Lee, Sooheyong ^a   Boutet, Sebastien ^a   Williams, Garth ^a   Tono, Kensuke ^b   Yabashi, Makina ^b   Hastings, Jerome B ^a  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b RIKEN   (Japan)

Author keywords

FEL; Hard X rays; Inline; Intensity position monitor; LCLS; SASE; Single shot

Indexed keywords

HARD X RAY; INLINE; INTENSITY-POSITION MONITOR; LCLS; SASE; SINGLE-SHOT;

ELECTRON SOURCES; FREE ELECTRON LASERS; X RAY APPARATUS; X RAY OPTICS;

X RAYS;

EID: 84855242058     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.893740     Document Type: Conference Paper

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