Functional integrated circuit analysis

Proceedings of the 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2012

Volumn , Issue , 2012, Pages 102-107

  Nedospasov, Dmitry ^a   Seifert, Jean Pierre ^a   Schlosser, Alexander ^a   Orlic, Susanna ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL INFORMATION; FUNCTIONAL ELEMENTS; FUNCTIONAL LAYOUT; MEMORY LAYOUT; OPTICAL EMISSIONS; POINTS OF INTEREST; TEST CASE;

MICROCONTROLLERS; SMART CARDS;

HARDWARE;

EID: 84864129512     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HST.2012.6224328     Document Type: Conference Paper

References (12)

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