When AES blinks: Introducing optical side channel

IET Information Security

Volumn 2, Issue 3, 2008, Pages 94-98

  Ferrigno, J ^a   Hlavac M ^b  

^a CNES   (France)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CRYPTOGRAPHY; INTEGRATED CIRCUITS; LIGHT; NETWORKS (CIRCUITS); PHOTONS;

OPTICAL-; SIDE CHANNELS;

ELECTRIC NETWORK ANALYSIS;

EID: 50849138825     PISSN: 17518709     EISSN: 17518717     Source Type: Journal    
DOI: 10.1049/iet-ifs:20080038     Document Type: Article

References (11)

1. Kocher, P.C., Jaffe, J., and Jun, B.: ' Differential power analysis ', CRYPTO'99: Proc. 19th Annual Int. Cryptology Conf., London, UK, 1999, p. 388-397
2. Gandolfi, K., Mourtel, C., and Olivier, F.: ' Electromagnetic analysis: concrete results ', Cryptographic Hardware and Embedded Systems-CHES2001, Third Int. Workshop, London, UK, 2001, p. 251-261
3. Kocher, P.C.: ' Timing attacks on implementations of Diffie-Hellman, RSA, DSS, and other systems ', CRYPTO'96: Proc. 16th Annual Int. Cryptology Conf., London, UK, 1996, p. 104-113
4. Microchip: PIC16F84A Data Sheet http://ww1.microchip.com/downloads/en/ devicedoc/35007b.pdf
5. Barnett, D., and Dattalo, S.: ' GNU PIC Utilities ', http:/gputils. sourceforge.net/
6. International Organization for Standardization: ISO/IEC 7816 -Identification cards - Integrated circuit(s) with contacts, http://www.iso.org/iso/iso_catalogue/catalogue_ tc/catalogue_detail.htm? csnumber=38770
7. Ultratec: TEC Note 1 Selected area polishing (SAP) of semiconductor devices - F.A.Q, http://www.ultratecusa.com/PDFlibrary/ Selected%20Area%20Polishing%20-%20FAQ.pdf
8. Stellari, F., Tosi, A., Zappa, F., and Cova, S.: ' CMOS circuit analysis with luminescence measurements and simulations ', ESSDERC'02: Proc. 32nd European Solid-State Device Research Conf., New York, NY, 2002, p. 495-498
9. Vallett, D.: ' Picosecond imaging circuit analysis ', Microelectronics Failure Analysis, Materials Park, OH, 2004, p. 370-379
10. Desplats, R., Faggion, G., Remmach, M., Beaudoin, F., Perdu, P., and Lewis, D.: ' Time resolved photon emission processing flow for IC analysis ', 15th, European Symp. Reliability of Electron Devices, Failure Physics and Analysis, 2004
11. Kölzer, J., Boit, C., Dallmann, A., Deboy, G., Otto, J., and Weinmann, D.: ' Quantitative emission microscopy ', J. Appl. Phys., 1992, 71, p. R23-R41 0021-8979