Effect of different dopant elements (Al, Mg and Ni) on microstructural, optical and electrochemical properties of ZnO thin films deposited by spray pyrolysis (SP)

Superlattices and Microstructures

Volumn 52, Issue 3, 2012, Pages 594-604

  Benzarouk, Hayet ^a   Drici, Abdelaziz ^a   Mekhnache, Mounira ^a   Amara, Abdelaziz ^a   Guerioune, Mouhamed ^a   Bernède, Jean Christian ^b   Bendjffal, Hacen ^a  

^a BADJI MOKHTAR UNIVERSITY   (Algeria)

^b LAMP   (France)

Author keywords

Doped ZnO; Semiconductors; Spray pyrolysis; Tafel; XRD; Zinc oxide

Indexed keywords

AMBIENT AIR; DOPED ZNO; EFFECT OF DOPING; ELECTROCHEMICAL STUDIES; MICRO-STRUCTURAL; PREFERENTIAL ORIENTATION; PYROLYSIS PROCESS; SODA GLASS; TAFEL; TRANSPARENT CONDUCTIVE THIN FILMS; WURTZITE STRUCTURE; XRD; ZINC ACETATE; ZINC OXIDE (ZNO); ZNO LAYERS; ZNO THIN FILM;

CORROSION RESISTANCE; ELECTROCHEMICAL PROPERTIES; METALLIC FILMS; OPTICAL FILMS; SEMICONDUCTOR DOPING; SEMICONDUCTOR MATERIALS; SPRAY PYROLYSIS; SUBSTRATES; X RAY DIFFRACTION; ZINC COMPOUNDS; ZINC SULFIDE;

ZINC OXIDE;

EID: 84864037471     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2012.06.007     Document Type: Article

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