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Volumn 3, Issue 3, 2012, Pages 407-417

Compensation method for obtaining accurate, sub-micrometer displacement measurements of immersed specimens using electronic speckle interferometry

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; DISPLACEMENT MEASUREMENT; MICROMETERS; SPECKLE;

EID: 84863938272     PISSN: None     EISSN: 21567085     Source Type: Journal    
DOI: 10.1364/BOE.3.000407     Document Type: Article
Times cited : (15)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.