Three-dimensional deformation field measurements with simultaneous TV holography and electronic speckle photography

Applied Optics

Volumn 36, Issue 16, 1997, Pages 3645-3648

  Sjodahl M ^a   Saldner, H O ^a  

^a LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000560396     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.003645     Document Type: Article

References (14)

1. R. J. Pryputniewicz, “Quantitative determination of displacements and strain from holograms,” in Holographic Interferom-etry, P. K. Rastogi, ed. (Springer-Verlag, Berlin, 1994).
2. P. F. Luo, Y. J. Chao, M. A. Sutton, and W. H. Peters, III, “Accurate measurement of three-dimensional deformations in deformable and rigid bodies using computer vision,” Exp. Mech. 33, 123-132 (1993).
3. L. Benckert, M. Jonsson, and N. E. Molin, “Measuring true in-plane displacements of a surface by stereoscopic white light speckle photography,” Opt. Eng. 26, 167-169 (1987).
4. R. Henao, F. Medina, H. J. Rabal, and M. Trivi, “Threedimensional speckle measurements with a diffraction grating,” Appl. Opt. 32, 726-729 (1993).
5. Y. Wang and F.-P. Chiang, “New moire interferometry for measuring three-dimensional displacements,” Opt. Eng. 33, 2654-2658 (1994).
6. F. P. Chiang and D. W. Li, “Random (speckle) patterns for displacement and strain measurement: some recent advances,” Opt. Eng. 24, 936-943 (1985).
7. O. J. Lokberg, “Recent development in video speckle interferometry,” in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dek-ker, New York, 1993).
8. M. Sjodahl and L. R. Benckert, “Electronic speckle photography: analysis of an algorithm giving the displacement with subpixel accuracy,” Appl. Opt. 32, 2278-2284 (1993).
9. M. Sjodahl and L. R. Benckert, “Systematic and random errors in electronic speckle photography,” Appl. Opt. 33, 7461-7471 (1994).
10. M. Sjodahl, “Electronic speckle photography: increased accuracy by nonintegral pixel shifting,” Appl. Opt. 33, 6667-6673 (1994).
11. K. A. Stetson, “Theory and applications of electronic holography,” in Proceedings of the International Conference on Hologram Interferometry and Speckle Metrology, K. A. Stetson and R. J. Pryputniewicz, eds. (Society for Experimental Mechanics, Bethel, Conn., 1990), pp. 294-300.
12. K. Creath, “Phase-measuring techniques for nondestructive testing,” in Proceedings of the International Conference on Hologram Interferometry and Speckle Metrology, K. A. Stetson and R. J. Pryputniewicz, eds. (Society for Experimental Mechanics, Bethel, Conn., 1990), pp. 473-479.
13. J. M. Huntley, “Random-phase measurement errors in digital speckle pattern interferometry,” Opt. Lasers Eng. 26, 131-150 (1997).
14. J. M. Huntley, “Noise-immune phase unwrapping algorithm,” Appl. Opt. 28, 3268-3270 (1989).