Decorrelation-induced phase errors in phase-shifting speckle interferometry

Applied Optics

Volumn 36, Issue 16, 1997, Pages 3657-3667

  Lehmann, Mathias ^a  

^a EPFL   (Switzerland)

Author keywords

Decorrelation; Speckle interferometry; Speckle statistics

Indexed keywords

EID: 0038595777     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.003657     Document Type: Article

References (10)

1. D. W. Robinson and G. T. Reid, eds., Interferogram Analysis: Digital Fringe Pattern Measurement Techniques (Institute of Physics Publishing, Bristol, UK, 1993).
2. W. Juptner and W. Osten, eds., Fringe ’93: Proceedings of the Second International Workshop on Automatic Processing of Fringe Patterns (Akademie Verlag, Berlin, 1993).
3. J. W. Goodman, “Statistical properties of laser speckle patterns,” in Laser Speckle and Related Phenomena, J. C. Dainty, ed. (Springer-Verlag, Berlin, 1984).
4. M. Lehmann, “Phase-shifting speckle interferometry with unresolved speckles: a theoretical investigation,” Opt. Commun. 128, 325-340 (1996).
5. E. Ochoa and J. W. Goodman, “Statistical properties of ray directions in a monochromatic speckle pattern,” J. Opt. Soc. Am. A 73, 943-949 (1983).
6. S. Donati and G. Martini, “Speckle-pattern intensity and phase: second-order conditional statistics,” J. Opt. Soc. Am.69, 1690-1694 (1979).
7. C. K. Hong, H. S. Ryu, and H. C. Lim, “Least-squares fitting of the phase map obtained in phase-shifting electronic speckle pattern interferometry,” Opt. Lett. 20, 931-933 (1995).
8. J. M. Huntley, “Random phase measurement errors in digital speckle pattern interferometry,” in Interferometry VII: Techniques and Applications, M. Kujawinska, R. J. Pryputniewicz, and M. Takeda, eds., Proc. SPIE 2544, 246-257 (1995).
9. K. Creath, “Phase-shifting speckle interferometry,” in International Conference on Speckle, H. H. Arsenault, ed., Proc. SPIE 556, 337-346 (1985).
10. X. Colonna de Lega and P. Jacquot, “Interferometric deformation measurement using object-induced dynamic phase shifting,” in Optical Inspection and Micromeasurements, C. Gorecki, ed., Proc. SPIE 2782, 169-179 (1996).