Solving structure with sparse, randomly-oriented x-ray data

Optics Express

Volumn 20, Issue 12, 2012, Pages 13129-13137

  Philipp, Hugh T ^a   Ayyer, Kartik ^a   Tate, Mark W ^a   Elser, Veit ^a   Gruner, Sol M ^a,b  

^a Laboratory of Atomic and Solid State Physics and Cornell Center for Materials Research   (United States)

^b Department of Molecular Biology and Genetics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MASKS;

EXPECTATION-MAXIMIZATION ALGORITHMS; IMAGE CONTRASTS; IMAGING EXPERIMENTS; ORIENTED PARTICLES; PRIOR KNOWLEDGE; SINGLE-PARTICLE; STRUCTURAL INFORMATION; X RAY DATA; X RAY MASK; X-RAY FREE ELECTRON LASERS;

X RAYS;

EID: 84863741531     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.013129     Document Type: Article

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