Femtosecond radiation experiment detector for X-ray free-electron laser (XFEL) coherent X-ray imaging

IEEE Transactions on Nuclear Science

Volumn 57, Issue 6 PART 2, 2010, Pages 3795-3799

  Philipp, Hugh T ^a   Koerner, Lucas J ^a   Hromalik, Marianne S ^a   Tate, Mark W ^a   Gruner, Sol M ^a,b  

^a Sibley School of Mechanical and Aerospace Engineering   (United States)

^b Department of Population Medicine and Diagnostic Sciences   (United States)

Author keywords

Free electron lasers; radiation detectors; semiconductor device measurement; silicon radiation detectors; X ray detector; X ray detectors; X ray lasers

Indexed keywords

COHERENT X-RAYS; CORNELL UNIVERSITY; DAMAGE MEASUREMENT; DIFFRACTION DATA; FEMTOSECOND PULSE; FEMTOSECOND RADIATION; FEMTOSECOND TIME SCALE; FRAME RATE; GAIN PATTERNS; HIGH RESISTIVITY SILICON; LINAC COHERENT LIGHT SOURCE; LOW NOISE; NOISE PERFORMANCE; PIXEL ARRAYS; PIXEL POINTS; PIXEL SIZE; RESPONSE PROFILE; SEMICONDUCTOR DEVICE MEASUREMENT; SILICON RADIATION DETECTORS; SINGLE PHOTON SENSITIVITY; SINGLE PHOTONS; X-RAY DETECTOR; X-RAY DETECTORS; X-RAY FREE ELECTRON LASERS; X-RAY TESTING;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DIFFRACTION; DIODES; ELECTROMAGNETIC PULSE; ELECTRONS; FREE ELECTRON LASERS; LASER BEAM EFFECTS; LASERS; LIGHT SOURCES; OPTICAL TRANSFER FUNCTION; PARTICLE BEAMS; PHOTONS; PIXELS; RADIATION; RADIATION DAMAGE; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR LASERS; SEMICONDUCTOR SWITCHES; SILICON DETECTORS; X RAY ANALYSIS; X RAY APPARATUS; X RAY LASERS; X RAYS;

RADIATION DETECTORS;

EID: 78650353562     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2010.2085445     Document Type: Article

References (9)

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