Femtosecond radiation experiment detector for X-ray free-electron laser (XFEL) coherent X-ray imaging

IEEE Transactions on Nuclear Science

Volumn 57, Issue 6 PART 2, 2010, Pages 3795-3799

  Philipp, Hugh T ^a   Koerner, Lucas J ^a   Hromalik, Marianne S ^a   Tate, Mark W ^a   Gruner, Sol M ^a,b  

^a Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

Free electron lasers; radiation detectors; semiconductor device measurement; silicon radiation detectors; X ray detector; X ray detectors; X ray lasers

Indexed keywords

COHERENT X-RAYS; CORNELL UNIVERSITY; DAMAGE MEASUREMENT; DIFFRACTION DATA; FEMTOSECOND PULSE; FEMTOSECOND RADIATION; FEMTOSECOND TIME SCALE; FRAME RATE; GAIN PATTERNS; HIGH RESISTIVITY SILICON; LINAC COHERENT LIGHT SOURCE; LOW NOISE; NOISE PERFORMANCE; PIXEL ARRAYS; PIXEL POINTS; PIXEL SIZE; RESPONSE PROFILE; SEMICONDUCTOR DEVICE MEASUREMENT; SILICON RADIATION DETECTORS; SINGLE PHOTON SENSITIVITY; SINGLE PHOTONS; X-RAY DETECTOR; X-RAY DETECTORS; X-RAY FREE ELECTRON LASERS; X-RAY TESTING;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DIFFRACTION; DIODES; ELECTROMAGNETIC PULSE; ELECTRONS; FREE ELECTRON LASERS; LASER BEAM EFFECTS; LASERS; LIGHT SOURCES; OPTICAL TRANSFER FUNCTION; PARTICLE BEAMS; PHOTONS; PIXELS; RADIATION; RADIATION DAMAGE; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR LASERS; SEMICONDUCTOR SWITCHES; SILICON DETECTORS; X RAY ANALYSIS; X RAY APPARATUS; X RAY LASERS; X RAYS;

RADIATION DETECTORS;

EID: 78650353562     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2010.2085445     Document Type: Article

References (9)

1. R. Neutze, R.Wouts, D. van der Spoel, E. Weckert, and J. Hajdu, "Potential for biomolecular imaging with femtosecond X-ray pulses," Nature, vol. 406, no. 6797, pp. 752-757, Aug. 2000.
2. N.-T. D. Loh and V. Elser, "Reconstruction algorithm for single-particle diffraction imaging experiments," Phys. Rev. E (Statistical, Nonlinear, and Soft Matter Physics), vol. 80, no. 2, p. 026705, 2009.
3. G. S. A. H. J. Huldt, "Diffraction imaging of single particles and biomolecules," J. Structural Biology, vol. 144, pp. 219-227, 2003.
4. S. L. Barna, "Development of a microsecond framing two-dimensional pixel array detector for time-resolved x-ray diffraction," Ph.D. dissertation, Cornell University, Ithaca, NY, 1997.
5. L. J. Koerner, H. T. Philipp, M. S. Hromalik, M. W. Tate, and S. M. Gruner, "X-ray tests of a pixel array detector for coherent X-ray imaging at the linac coherent light source," J. Instrumentation, vol. 4, no. 03, p. P03001, 2009.
6. S. Kleinfelder, S. Lim, X. Liu, and A. E. Gamal, "A 10 000 frames/s CMOS digital pixel sensor," IEEE J. Solid State Circuits, vol. 36, no. 12, pp. 2049-2059, 2001.
7. M. S. Hromalik, H. T. Philipp, L. J. Koerner, M. W. Tate, and S. M. Gruner, "Data acquisition and control for a pixel array detector (PAD) for single particle scattering at the linac coherent light source (LCLS)," in Proc. 2007 IEEE Nucl. Sci. Symp. Conf. Record, 2007, pp. 1744-1750.
8. D. Schuette, "A mixed analog and digital pixel array detector for sychrotron x-ray imaging," Ph.D. dissertation, Cornell University, Ithaca, NY, 2008.
9. W.Vernon, M. Allin, R. Hamlin, T. Hontz, D. Nguyen, F. Augustine, S. M. Gruner, N.H. Xuong, D. R. Schuette, M. W. Tate, and L. J. Koerner, "First results from the 128×128 pixel mixed-mode Si X-ray detector chip," Hard X-Ray and Gamma-Ray Detector Physics IX, vol. 6706, no. 1, p. 67060U, 2007.