Femtosecond dark-field imaging with an X-ray free electron laser

Optics Express

Volumn 20, Issue 12, 2012, Pages 13501-13512

  Martin, A V ^a   Loh, N D ^b   Hampton, C Y ^b   Sierra, R G ^b   Wang, F ^a   Aquila, A ^a,c   Bajt, S ^a   Barthelmess, M ^a   Bostedt, C ^b   Bozek, J D ^b   Coppola, N ^c   Epp, S W ^d,e   Erk, B ^d,e   Fleckenstein, H ^a   Foucar, L ^d,f   Frank, M ^g   Graafsma, H ^a   Gumprecht, L ^a   Hartmann, A ^h   Hartmann, R ^h   Hauser, G ^i,j   Hirsemann, H ^a   Holl, P ^h   Kassemeyer, S ^f   Kimmel, N ^i,j   Liang, M ^a   Lomb, L ^f   Maia, F R N C ^k   Marchesini, S ^k   Nass, K ^a,l   Pedersoli, E ^m   Reich, C ^h   Rolles, D ^d,f   Rudek, B ^d,e   Rudenko, A ^d,e   Schulz, J ^a,c   Shoeman, R L ^f   Soltau, H ^h   Starodub, D ^b   Steinbrener, J ^f   Stellato, F ^a   Struder L ^i,j   Ullrich, J ^d,e,n   Weidenspointner, G ^i,j   White, T A ^a   Wunderer, C B ^a   Barty, A ^a   Schlichting, I ^d,f   Bogan, M J ^b   Chapman, H N ^a,l   more..

^a DESY   (Germany)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c EUROPEAN XFEL GMBH   (Germany)

^d Center for Free Electron Laser Science   (Germany)

^e MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^f MAX PLANCK INSTITUTE FOR MEDICAL RESEARCH   (Germany)

^g LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^h PNSENSOR GMBH   (Germany)

ⁱ MPI HALBLEITERLABOR   (Germany)

^j MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^k LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^l UNIVERSITY OF HAMBURG   (Germany)

^m SINCROTRONE TRIESTE   (Italy)

ⁿ PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

more..

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MATERIALS; ELECTRONS; FREE ELECTRON LASERS; LIGHT SOURCES; MICROMETERS; VIRUSES;

AIRBORNE PARTICULATE MATTERS; COHERENT DIFFRACTIVE IMAGING; DARK FIELD MICROSCOPY; DIFFRACTIVE IMAGING; LINAC COHERENT LIGHT SOURCE; LOW-FREQUENCY DATA; NANOMETER LENGTH SCALE; X-RAY FREE ELECTRON LASERS;

X RAY LASERS;

ARTICLE; COMPUTER SIMULATION; ELECTRON; LASER; METHODOLOGY; SOOT; THREE DIMENSIONAL IMAGING; TIME; TRANSMISSION ELECTRON MICROSCOPY; X RAY;

COMPUTER SIMULATION; ELECTRONS; IMAGING, THREE-DIMENSIONAL; LASERS; MICROSCOPY, ELECTRON, TRANSMISSION; SOOT; TIME FACTORS; X-RAYS;

EID: 84863730620     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.013501     Document Type: Article

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