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Volumn 1437, Issue , 2012, Pages 89-93

Fabrication and characterization of analyzer gratings with high aspect ratios for phase contrast imaging using a Talbot interferometer

Author keywords

LIGA; phase contrast imaging; Talbot interferometer; X ray grating interferometer

Indexed keywords


EID: 84863622595     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3703349     Document Type: Conference Paper
Times cited : (23)

References (17)
  • 8
    • 33750687279 scopus 로고    scopus 로고
    • Tomography with grating interferometers at low-brilliance sources
    • Developments in X-Ray Tomography V
    • T. Weitkamp, C. David, C. Kottler, O. Bunk, and F. Pfeiffer, "Tomography with grating interferometers at low-brilliance sources," in Developments in X-Ray Tomography V, SPIE Conference Proceedings 6318, 2006, pp. 6318-28.
    • (2006) SPIE Conference Proceedings , vol.6318 , pp. 6318-6328
    • Weitkamp, T.1    David, C.2    Kottler, C.3    Bunk, O.4    Pfeiffer, F.5
  • 10
    • 77649186135 scopus 로고    scopus 로고
    • Ph.D. thesis, Faculty of Sciences Niels Bohr Institute, University of Copenhagen Universitetsparken 5 DK-2100 Copenhagen
    • M. Bech, X-ray imaging with a grating interferometer, Ph.D. thesis, Faculty of Sciences Niels Bohr Institute, University of Copenhagen Universitetsparken 5 DK-2100 Copenhagen (2009).
    • (2009) X-ray Imaging with A Grating Interferometer
    • Bech, M.1
  • 16
    • 84863615915 scopus 로고    scopus 로고
    • G. Fowles, Dover publications, Inc. New York pp. 401-407 (1975).
    • G. Fowles, Dover publications, Inc. New York pp. 401-407 (1975).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.