The optical and structural properties of CuIn 1-xGa xSe 2 thin films fabricated with various Ga contents by using the co-evaporation technique

Journal of the Korean Physical Society

Volumn 60, Issue 10, 2012, Pages 1708-1712

  Jo, Hyun Jun ^a,b   Kim, Dae Hwan ^a   Kim, Chan ^a   Hwang, Dae Kue ^a   Sung, Shi Joon ^a   Kim, Jeong Hwa ^a   Bae, In Ho ^b  

^a Daegu Gyeongbuk Institute of Science and Technology   (South Korea)

^b Yeungnam University   (South Korea)

Author keywords

CIGS; Defect; Ga In+Ga ratio

Indexed keywords

EID: 84863612986     PISSN: 03744884     EISSN: 19768524     Source Type: Journal    
DOI: 10.3938/jkps.60.1708     Document Type: Article

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