Ga-grading profiles formed by incorporation of gallium into Cu(In 1-x Ga x )Se 2 absorber thin films

Applied Surface Science

Volumn 258, Issue 22, 2012, Pages 8636-8640

  Wang, J ^a   Zhang, Y F ^a   Dong, F ^a   Zhu, J ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Chalcopyrite; Ga grading; Gallium incorporation

Indexed keywords

COPPER COMPOUNDS; FILM PREPARATION; GALLIUM; GRADING; SELENIUM COMPOUNDS; THIN FILMS; TUNNELING (EXCAVATION);

CHALCOPYRITE; CHALCOPYRITE STRUCTURES; DIFFERENT PRECURSORS; GA-GRADING; GRADED DISTRIBUTIONS; HIGHER DIFFRACTION; POLYCRYSTALLINE THIN FILM; TWO-STAGE METHODS;

GALLIUM COMPOUNDS;

EID: 84863507200     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.05.065     Document Type: Article

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