Characterization of M-π-n CdTe pixel detectors coupled to HEXITEC readout chip

Journal of Instrumentation

Volumn 7, Issue 1, 2012, Pages

  Veale, M C ^a   Kalliopuska, J ^b   Pohjonen, H ^b   Andersson, H ^c   Nenonen, S ^c   Seller, P ^a   Wilson, M D ^a  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b Microsystems and Nanoelectronics   (Finland)

^c Oxford Instruments Analytical Oy   (Finland)

Author keywords

Detector control systems (detector and experiment monitoring and slow control systems, architecture, hardware, algorithms, databases); Solid state detectors; X ray detectors; X ray radiography and digital radiography (DR)

Indexed keywords

EID: 84863416226     PISSN: None     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/7/01/C01035     Document Type: Article

References (12)

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