Creating self-organized submicrometer contact instability patterns in soft elastic bilayers with a topographically patterned stamp

ACS Applied Materials and Interfaces

Volumn 4, Issue 1, 2012, Pages 355-362

  Mukherjee, Rabibrata ^a   Sharma, Ashutosh ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

bilayer; elastic film; patterns; self organization; soft lithography; thin film instability

Indexed keywords

BI-LAYER; ELASTIC FILMS; PATTERNS; SELF ORGANIZATION; SOFT LITHOGRAPHY; THIN FILM INSTABILITY;

LITHOGRAPHY; MORPHOLOGY; SURFACE TENSION; ULTRATHIN FILMS;

STABILITY;

EID: 84863393635     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am201422h     Document Type: Article

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