Dielectric responses and scaling behaviors in Aurivillius Bi 6Ti 3Fe 2O 18 multiferroic thin films

Applied Physics Letters

Volumn 100, Issue 8, 2012, Pages

  Bai, W ^a,b   Chen, G ^a   Zhu, J Y ^a   Yang, J ^a   Lin, T ^b   Meng, X J ^b   Tang, X D ^a   Duan, C G ^a,b   Chu, J H ^a,b  

^a EAST CHINA NORMAL UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AURIVILLIUS; DIELECTRIC RESPONSE; DYNAMICAL PROCESS; GRAIN INTERIORS; HOPPING CARRIERS; HOPPING PROCESS; MULTIFERROIC THIN FILMS; SCALING BEHAVIOR; TEMPERATURE DEPENDENT;

OXYGEN VACANCIES; THIN FILMS;

SCALING LAWS;

EID: 84863282413     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3688033     Document Type: Article

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