The upper limit of thermoelectric figure of merit: Importance of electronic thermoelectric efficiency

Journal of Physics D: Applied Physics

Volumn 45, Issue 8, 2012, Pages

  Li, Jing ^a   Yeung, Tin Cheung Au ^a   Kam, Chan Hin ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT; PHYSICAL PHENOMENA; SILICON NANOWIRES; THERMOELECTRIC EFFICIENCY; THERMOELECTRIC FIGURE OF MERIT; UPPER LIMITS;

NANOWIRES; PROBABILITY DISTRIBUTIONS;

EFFICIENCY;

EID: 84863170592     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/45/8/085102     Document Type: Article

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