Photoemission spectroscopy characterization of attempts to deposit MoO 2 thin film

International Journal of Photoenergy

Volumn 2011, Issue , 2011, Pages

  Irfan, ^a   So, Franky ^b   Gao, Yongli ^a,c  

^a UNIVERSITY OF ROCHESTER   (United States)

^b J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^c CENTRAL SOUTH UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; MOLYBDENUM OXIDE; OXIDATION; THERMAL EVAPORATION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

4-STATE; DEPOSITION STAGES; ELECTRONIC.STRUCTURE; EVAPORATED FILMS; OXIDATION STATE; STRUCTURE OF FILMS; THIN-FILMS; ULTRAVIOLET PHOTOEMISSION; X RAY PHOTOEMISSION SPECTROSCOPY; XPS ANALYSIS;

DEPOSITS;

EID: 84862955454     PISSN: 1110662X     EISSN: 1687529X     Source Type: Journal    
DOI: 10.1155/2011/314702     Document Type: Article

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