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Volumn 11, Issue 5, 2011, Pages 959-966

Vertical silicon nanowires with atomic layer deposition with HfO 2 membrane for pH sensing application

Author keywords

electrolyteinsulatorsemiconductor (EIS); rapid thermal annealing (RTA); Silicon nanowire (SiNW)

Indexed keywords

ELECTROLYTEINSULATORSEMICONDUCTOR (EIS); FLAT-BAND VOLTAGE SHIFT; HAFNIUM DIOXIDE; HIGH-PRECISION; LINEAR RELATIONSHIPS; PH SENSING; POST-DEPOSITION; SENSING MEMBRANES; SENSING PROPERTY; SILICON NANOWIRES; SURFACE-TO-VOLUME RATIO; ULTRASENSITIVE;

EID: 84862944821     PISSN: 02195194     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219519411004897     Document Type: Conference Paper
Times cited : (3)

References (19)
  • 19
    • 84862962152 scopus 로고    scopus 로고
    • Thickness effect and rapid thermal annealing treatment of s ingle atomic layer deposition HfO2 layer on EIS for pH sensor application, in
    • Tokyo Institute of Technology, Tokyo, Japan, 20-21 January 2011
    • Chuang H-C, Lu T-F, Wang J-C, Yang C-M, Lai C-S, Thickness effect and rapid thermal annealing treatment of s ingle atomic layer deposition HfO2 layer on EIS for pH sensor application, in Int. Workshop on Dielectric Thin Film , Tokyo Institute of Technology, Tokyo, Japan, 20-21 January 2011, pp. 77-78.
    • Int. Workshop on Dielectric Thin Film , pp. 77-78
    • Chuang, H.-C.1    Lu, T.-F.2    Wang, J.-C.3    Yang, C.-M.4    Lai, C.-S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.