Structural, optical and electrical properties of low-temperature deposition Cu(In xGa 1-x)Se 2 thin films

Solar Energy Materials and Solar Cells

Volumn 99, Issue , 2012, Pages 356-361

  Zhang, Li ^a   Liu, Fang Fang ^a   Li, Feng Yan ^a   He, Qing ^a   Li, Bao Zhang ^a   Li, Chang Jian ^a  

^a NANKAI UNIVERSITY   (China)

Author keywords

CIGS solar cells; Conversion efficiency; Cu(In, Ga)Se 2; Substrate temperature

Indexed keywords

ANTI-REFLECTION; AS-GROWN; CHEMICAL COMPOSITIONS; CIGS FILMS; CIGS SOLAR CELLS; CO-EVAPORATIONS; COMPOSITIONAL RATIO; CU(IN , GA)SE; CU(IN, GA)SE 2; GLASS SUBSTRATES; HALL EFFECT MEASUREMENT; HIGH-EFFICIENCY SOLAR CELLS; HIGH-T; LOW SUBSTRATE TEMPERATURE; LOW TEMPERATURES; LOW-TEMPERATURE DEPOSITION; LOW-TEMPERATURE PROCESS; OPTICAL AND ELECTRICAL PROPERTIES; POLYCRYSTALLINE; REFLECTANCE SPECTRUM; SCANNING ELECTRON MICROSCOPE; SUBSTRATE TEMPERATURE; TEMPERATURE DEPENDENT;

CONVERSION EFFICIENCY; EFFICIENCY; GALLIUM; HALL EFFECT; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; SOLAR ABSORBERS; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ELECTRIC PROPERTIES;

EID: 84862806228     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2012.01.002     Document Type: Article

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