The film thickness dependent thermal stability of Al2O 3:Ag thin films as high-temperature solar selective absorbers

Journal of Nanoparticle Research

Volumn 14, Issue 3, 2012, Pages

  Xiao, Xiudi ^a   Xu, Gang ^a   Xiong, Bin ^a   Chen, Deming ^a   Miao, Lei ^a  

^a GUANGZHOU INSTITUTE OF ENERGY CONVERSION   (China)

Author keywords

Energy conversion; Solar selective absorbers; SPR absorption; Thermal stability

Indexed keywords

AGGLOMERATION; ALUMINA; ALUMINUM OXIDE; ANNEALING; ENERGY CONVERSION; EVAPORATION; FILM THICKNESS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MULTILAYER FILMS; MULTILAYERS; OPTICAL PROPERTIES; PLASMONS; SOLAR ABSORBERS; SOLAR CONTROL FILMS; STABILITY; SURFACE PLASMON RESONANCE; THERMODYNAMIC STABILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

ABSORBING LAYERS; EVOLUTION PROCESS; HIGH TEMPERATURE; OPTICAL PROPERTIES OF THIN FILMS; PARTICLE DIFFUSION; SOLAR SELECTIVE ABSORBERS; SPR ABSORPTIONS; SURFACE PLASMON RESONANCE ABSORPTION;

FILM PREPARATION;

ALUMINUM OXIDE;

ABSORPTION; ANNEALING; ARTICLE; CHEMICAL STRUCTURE; DIFFUSION; EVAPORATION; FILM; HIGH TEMPERATURE; OPTICS; PARTICLE SIZE; PRIORITY JOURNAL; THERMOSTABILITY; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 84862783316     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-012-0746-3     Document Type: Article

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