Thermal noise in track-and-hold circuits: Analysis and simulation techniques

IEEE Solid-State Circuits Magazine

Volumn 4, Issue 2, 2012, Pages 46-54

  Murmann, Boris ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84862675986     PISSN: 19430582     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MSSC.2012.2192190     Document Type: Article

References (18)

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