Pixel noise suppression via SoC management of tapered reset in a 1920 × 1080 CMOS image sensor

IEEE Journal of Solid-State Circuits

Volumn 40, Issue 12, 2005, Pages 2766-2775

  Kozlowski, Lester J ^a,b,d   Rossi, Giuseppe ^a,b   Blanquart, Laurent ^a,b   Marchesini, Roberto ^a,b   Huang, Ying ^a,b   Chow, Gregory ^b   Richardson, John ^b   Standley, David ^c  

^a IEEE   (United States)

^b AltaSens Inc   (United States)

^c Biomorphic VLSI   (United States)

^d IEEE Electron Devices Society ^*  (United States)

Author keywords

Active pixel sensor; CMOS image sensor; kTC noise

Indexed keywords

ACTIVE PIXEL SENSORS; CMOS IMAGE SENSORS; KTC NOISE; PIXEL NOISE SUPPRESSION;

CAPACITANCE; CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; IMAGING TECHNIQUES; MICROPROCESSOR CHIPS; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE;

IMAGE SENSORS;

EID: 29044446953     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2005.858480     Document Type: Conference Paper

References (17)

1. M. H. White, D. R. Lampe, F. C. Blaha, and I. A. Mack, IEEE J. Solid-State Circuits, vol. SC-9, no. 1, pp. 1-12, Feb. 1974.
2. L. Kozlowski, J. Luo, and A. Tomasini, "Performance limits in visible and infrared imager sensors," in IEDM Tech. Dig., Dec. 1999, pp. 867-870.
3. K. Mitani, M. Sugawara, and F. Okano, "Experimental ultrahigh-definition color camera system with three 8 M pixel CCDs," SMPTE J., vol. 111, no. 3, Apr. 2002.
4. M. Ohbo, I. Akiyama, and T. Tanaka, "A new noise suppression method for high-definition CCD cameras," IEEE Trans. Consum. Electron., vol. 35, no. 3, pp. 368-374, Aug. 1989.
5. L. J. Kozlowski, S. A. Cabelli, R. Kezer, and W. E. Kleinhans, "10 × 132 readout with 25 μm pitch and on-chip signal processing including CDS and TDI," in Proc. SPIE, vol. 1684, Apr. 1992, pp. 222-230.
6. S. K. Mendis, S. E. Kemeny, R. C. Gee, B. Pain, C. O. Staller, Q. Kim, and E. R. Possum, "CMOS active pixel image sensors for highly integrated imaging systems," IEEE J. Solid-State Circuits, vol. 32, no. 2, pp. 187-197, Feb. 1997.
7. A. M. Fowler and I. Gatley, "Demonstration of an algorithm for read-noise reduction in infrared arrays," Astrophys. J. Lett., pp. L33-L35, 1990.
8. P. Noble, "Light sensitive arrays based on photodiodes combined with M.O.S. devices," presented at the IEE Conf. Integrated Circuits, East-bourne, U.K., May 1967.
9. L. J. Kozlowski, S. A. Cabelli, D. E. Cooper, and K. Vural, "Low background infrared hybrid focal plane array characterization," in Proc. SPIE, vol. 1946, 1993, pp. 199-213.
10. B. Fowler, M. Godfrey, J. Balicki, and J. Canfield, "Low-noise readout using active reset for CMOS APS," in Proc. SPIE, vol. 3965, May 2000, pp. 126-135.
11. L. Kozlowski et al., " Low-noise active pixel sensor for imaging arrays with global reset," U.S. Patent 6,493,030, Dec. 10, 2002.
12. B. Fowler, M. D. Godfrey, and S. Mims, "Analysis of reset noise suppression via stochastic differential equations," in Proc. IEEE Workshop on CCD and AIS, Jun. 2005, pp. 19-22.
13. H. K. Khalil, Nonlinear Systems, 2nd ed. Englewood Cliffs, NJ: Prentice-Hall, 1996.
14. L. J. Kozlowski, M. Loose, G. Rossi, Y. Huang, P. Kulkarni, and G. Chow, "Development status of CMOS 1920 × 1080 imaging system-on-chip for 60 p HDTV," presented at the SMPTE Advanced Motion Imaging Conf., Chicago, IL, Mar. 2004.
15. K. Mitani, M. Sugawara, and F. Okano, "Experimental ultrahigh-definition color camera system with three 8 M pixel CCDs," SMPTE J., vol. 111, no. 3, Apr. 2002.
16. S. Ohsawa and Y. Matsunaga, "Analysis of low signal level characteristics for high-sensitivity CCD charge detector," IEEE Trans. Electron Devices, vol. 39, no. 6, pp. 1465-1468, Jun. 1992.
17. J. Hynecek, "CCM-a new low-noise charge carrier multiplier suitable for detection of charge in small pixel CCD image sensors," IEEE Trans. Electron Devices, vol. 39, no. 8. pp. 1972-1975, Aug. 1992.