Relative-thickness dependence of exchange bias in bilayers and trilayers

Journal of Magnetism and Magnetic Materials

Volumn 324, Issue 19, 2012, Pages 3204-3208

  Hu, Yong ^a   Wu, Guo Zhen ^a   Liu, Yan ^a   Du, An ^a  

^a NORTHEASTERN UNIVERSITY   (China)

Author keywords

Exchange bias; Hysteresis; Magnetic film; Monte Carlo method

Indexed keywords

AFM; BI-LAYER; COMPONENT THICKNESS; EXCHANGE BIAS; FIELD COOLING; INTERFACIAL AREAS; INVERSE PROPORTIONS; LOW TEMPERATURES; SPINTRONICS APPLICATION; STACKING SEQUENCE; THERMAL DESTABILIZATION; THICKNESS VARIATION; TRILAYERS;

ANTIFERROMAGNETISM; HYSTERESIS; MAGNETIC FILMS;

MONTE CARLO METHODS;

EID: 84862590610     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2012.05.040     Document Type: Article

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