Multiple antiferromagnet/ferromagnet interfaces as a probe of grain-size-dependent exchange bias in polycrystalline Co/Fe50Mn50

Journal of Magnetism and Magnetic Materials

Volumn 309, Issue 1, 2007, Pages 54-63

  Bolon, Bruce T ^a   Haugen, M A ^a   Abin Fuentes, A ^a   Deneen, J ^a   Carter, C B ^a   Leighton, C ^a  

^a University of Minnesota   (United States)

Author keywords

Antiferromagnet; Exchange bias; Grain size; Uncompensated spins

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; COBALT COMPOUNDS; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ANTIFERROMAGNET GRAIN SIZE; ANTIFERROMAGNETS; UNCOMPENSATED SPINS;

POLYCRYSTALLINE MATERIALS;

EID: 33750075737     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.06.011     Document Type: Article

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